![Atomistic origin of microstrain broadening in diffraction data of nanocrystalline solids - ScienceDirect Atomistic origin of microstrain broadening in diffraction data of nanocrystalline solids - ScienceDirect](https://ars.els-cdn.com/content/image/1-s2.0-S1359645408008690-gr1.jpg)
Atomistic origin of microstrain broadening in diffraction data of nanocrystalline solids - ScienceDirect
![X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates - Yon - 2020 - physica status solidi (b) - Wiley Online Library X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates - Yon - 2020 - physica status solidi (b) - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/7f980edd-b797-4e97-88f3-bc298a02e77a/pssb201900579-fig-0001-m.jpg)
X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates - Yon - 2020 - physica status solidi (b) - Wiley Online Library
Application the Halder – Wagner to Calculation Crystal Size and Micro Strain by X-ray Diffraction Peaks Analysis
![Comparison of average crystallite size by X-ray peak broadening and Williamson–Hall and size–strain plots for VO2+ doped ZnS/CdS composite nanopowder | SpringerLink Comparison of average crystallite size by X-ray peak broadening and Williamson–Hall and size–strain plots for VO2+ doped ZnS/CdS composite nanopowder | SpringerLink](https://media.springernature.com/lw685/springer-static/image/art%3A10.1007%2Fs42452-019-1291-9/MediaObjects/42452_2019_1291_Fig1_HTML.png)
Comparison of average crystallite size by X-ray peak broadening and Williamson–Hall and size–strain plots for VO2+ doped ZnS/CdS composite nanopowder | SpringerLink
![X-ray diffraction line profile analysis of nanostructured nickel oxide: Shape factor and convolution of crystallite size and microstrain contributions - ScienceDirect X-ray diffraction line profile analysis of nanostructured nickel oxide: Shape factor and convolution of crystallite size and microstrain contributions - ScienceDirect](https://ars.els-cdn.com/content/image/1-s2.0-S1386947716305677-fx1.jpg)
X-ray diffraction line profile analysis of nanostructured nickel oxide: Shape factor and convolution of crystallite size and microstrain contributions - ScienceDirect
Crystallite size and micro-strain investigations of hydrothermally synthesized -Ga2O3 by different analytical methods
Microstrain and grain-size analysis from diffraction peak width and graphical derivation of high-pressure thermomechanics
![PDF] Modified Scherrer Equation to Estimate More Accurately Nano-Crystallite Size Using XRD | Semantic Scholar PDF] Modified Scherrer Equation to Estimate More Accurately Nano-Crystallite Size Using XRD | Semantic Scholar](https://d3i71xaburhd42.cloudfront.net/02aee3f992f23ed90f1250463c9ae305b2cfcc6e/3-Table1-1.png)
PDF] Modified Scherrer Equation to Estimate More Accurately Nano-Crystallite Size Using XRD | Semantic Scholar
![X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates - Yon - 2020 - physica status solidi (b) - Wiley Online Library X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates - Yon - 2020 - physica status solidi (b) - Wiley Online Library](https://onlinelibrary.wiley.com/cms/asset/eb45bd0b-6286-48d0-a1dc-c49fe51d0a7d/pssb201900579-fig-0002-m.jpg)